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Thermal stability of nitrogen-doped ZnSe grown by molecular beam epitaxy

  • Yukie Nishikawa
  • , Masayuki Ishikawa
  • , Peter J. Parbrook
  • , Masaaki Onomura
  • , Shinji Saito
  • , Gen ichi Hatakoshi

Research output: Contribution to journalArticlepeer-review

Abstract

The effect of thermal annealing on nitrogen-doped ZnSe grown by molecular beam epitaxy has been investigated as a function of nitrogen concentration. It was found that thermal stability of the nitrogen acceptors in highly nitrogen-doped ZnSe markedly degraded. Furthermore, in order to avoid significant decreases in net acceptor concentration by thermal annealing, the nitrogen concentration should be kept within the region of high electrical activity, that is below 1 × 1018 cm−3.

Original languageEnglish
Pages (from-to)807-811
Number of pages5
JournalJournal of Crystal Growth
Volume150
DOIs
Publication statusPublished - 1995
Externally publishedYes

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