Abstract
The effect of thermal annealing on nitrogen-doped ZnSe grown by molecular beam epitaxy has been investigated as a function of nitrogen concentration. It was found that thermal stability of the nitrogen acceptors in highly nitrogen-doped ZnSe markedly degraded. Furthermore, in order to avoid significant decreases in net acceptor concentration by thermal annealing, the nitrogen concentration should be kept within the region of high electrical activity, that is below 1 × 1018 cm−3.
| Original language | English |
|---|---|
| Pages (from-to) | 807-811 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 150 |
| DOIs | |
| Publication status | Published - 1995 |
| Externally published | Yes |
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