Abstract
In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.
| Original language | English |
|---|---|
| Pages (from-to) | 479-484 |
| Number of pages | 6 |
| Journal | Optica Applicata |
| Volume | 35 |
| Issue number | 4 |
| Publication status | Published - 2005 |
| Externally published | Yes |
Keywords
- Raman spectroscopy
- Semiconductor laser
- Thermoreflectance