Thin Soild Films: Editorial

Mircea Modreanu; Martin Murtagh; Jesús Ricote; Daniel Chateigner; Jürgen Schreiber

doi:10.1016/j.tsf.2003.10.039

Thin Soild Films: Editorial

Mircea Modreanu
, Martin Murtagh
, Jesús Ricote
, Daniel Chateigner
, Jürgen Schreiber

Optical Metrology Innovations Ltd.
Insto. Ciencia de Materiales de Madrid-CSIC
CRISMAT-ENSICAEN
Martin Luther University Halle-Wittenberg

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1-2
Number of pages	2
Journal	Thin Solid Films
Volume	450
Issue number	1
DOIs	https://doi.org/10.1016/j.tsf.2003.10.039
Publication status	Published - 22 Feb 2004
Event	Proceedings of Symposium M on Optical and X-Ray Metrology - Strasbourg, France Duration: 10 Jun 2003 → 13 Jun 2003

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10.1016/j.tsf.2003.10.039

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title = "Thin Soild Films: Editorial",

author = "Mircea Modreanu and Martin Murtagh and Jes{\'u}s Ricote and Daniel Chateigner and J{\"u}rgen Schreiber",

year = "2004",

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T2 - Proceedings of Symposium M on Optical and X-Ray Metrology

AU - Modreanu, Mircea

AU - Murtagh, Martin

AU - Ricote, Jesús

AU - Chateigner, Daniel

AU - Schreiber, Jürgen

PY - 2004/2/22

Y1 - 2004/2/22

UR - https://www.scopus.com/pages/publications/1142303870

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DO - 10.1016/j.tsf.2003.10.039

M3 - Article

AN - SCOPUS:1142303870

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VL - 450

SP - 1

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 1

Y2 - 10 June 2003 through 13 June 2003

ER -

Thin Soild Films: Editorial

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