Tight binding analysis of the electronic structure of dilute bismide and nitride alloys of GaAs

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Abstract

We use a nearest-neighbour sp3s* tight-binding Hamiltonian to investigate the electronic structure of GaAs-based dilute bismide and bismide-nitride alloys. We show that the observed strong variation of the band gap (Eg) and spin-orbit splitting energy (ΔSO) with Bi composition in GaBixAs1-x is due primarily to a band-anticrossing interaction between the extended states of the host matrix valence band maximum and highly localised Bi-related defect states lying in the valence band, with the change in Eg also having a significant contribution from a conventional alloy reduction in the conduction band edge energy. We calculate a crossover to an Eg < Δ SO regime at approximately 10.5% Bi composition in bulk GaBixAs 1-x, in agreement with recent experimental studies of GaBi xAs1-x epilayers grown on GaAs. Finally, we present calculations which show that the effects of N and of Bi are largely independent of each other in random GaBixNyAs1-x-y alloys, of relevance for future high efficiency photonic devices.

Original languageEnglish
Title of host publication2011 13th International Conference on Transparent Optical Networks, ICTON 2011
DOIs
Publication statusPublished - 2011
Event2011 13th International Conference on Transparent Optical Networks, ICTON 2011 - Stockholm, Sweden
Duration: 26 Jun 201130 Jun 2011

Publication series

NameInternational Conference on Transparent Optical Networks
ISSN (Electronic)2162-7339

Conference

Conference2011 13th International Conference on Transparent Optical Networks, ICTON 2011
Country/TerritorySweden
CityStockholm
Period26/06/1130/06/11

Keywords

  • band anti-crossing
  • dilute bismide alloy
  • dilute nitride alloy
  • Electronic structure
  • tight-binding

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