Total-Ionizing-Dose Effects on InGaAs FinFETs with Modified Gate-stack
- Simeng E. Zhao
- , Alessandro Paccagnella
- , Ronald D. Schrimpf
- , Robert A. Reed
- , Daniel M. Fleetwood
- , Stefano Bonaldo
- , Pengfei Wang
- , En Xia Zhang
- , Niamh Waldron
- , Nadine Collaert
- , Vamsi Putcha
- , Dimitri Linten
- , Simone Gerardin
- Vanderbilt University
- University of Padua
- Interuniversitair Micro-Elektronica Centrum
Research output: Contribution to journal › Article › peer-review