@inproceedings{1b37ea1412d24984a0d7d5a799047ddf,
title = "Towards a Universal Model of Dielectric Breakdown",
abstract = "We present a microscopic breakdown (BD) model in which chemical bonds are weakened by carrier injection and trapping into pre-existing structural defects (precursors) and by the electric field. The model goes much beyond the existing ones by consistently explaining the role of both current (a weakness of the E model) and temperature (a weakness of the power-law model), along with the role of the electric field. It also explains the non-Arrhenius temperature dependence of BD. It suggests a new comprehensive physics-based framework (with tight connections to material properties) reconciling the many breakdown theories proposed so far (E, power-law, 1/E,...) within a more universal breakdown model.",
keywords = "bond-breakage, carriers' injection, Dielectric Breakdown, Ginestra{\textregistered}, precursors",
author = "Andrea Padovani and Torraca, \{Paolo La\} and Jack Strand and Alexander Shluger and Valerio Milo and Luca Larcher",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 61st IEEE International Reliability Physics Symposium, IRPS 2023 ; Conference date: 26-03-2023 Through 30-03-2023",
year = "2023",
doi = "10.1109/IRPS48203.2023.10117846",
language = "English",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings",
address = "United States",
}