Transparent p/n diode device from a single zinc nitride sputtering target

  • V. Kambilafka
  • , A. Kostopoulos
  • , M. Androulidaki
  • , K. Tsagaraki
  • , M. Modreanu
  • , E. Aperathitis

Research output: Contribution to journalArticlepeer-review

Abstract

Zinc oxide (ZnO) thin films showing bipolar conductivity were fabricated by sputtering of zinc nitride target in plasma containing mixture of Ar-O 2 gasses. Sputtering in pure Ar plasma produced conductive and opaque zinc nitride (ZnN) films while upon introduction of oxygen up to 30% into the plasma highly transparent single phase polycrystalline n-type ZnO films have been grown. ZnN sputtering in Ar plasma containing more than 30% oxygen produced p-type ZnO films. Hall-effect and photoluminescence measurements revealed the presence of zinc vacancies and nitrogen which are acting as acceptor dopants in p-type ZnO. A heterostructure was fabricated in a single deposition run consisting of n-ZnN and p-ZnO which exhibited rectifying behavior with 2-2.5 V turn-on voltage. Improvements on the formed p/n heterostructure as well as the potential of using single sputtering target in fabrication of Zn-based homo- and hetero-junctions are discussed.

Original languageEnglish
Pages (from-to)1202-1206
Number of pages5
JournalThin Solid Films
Volume520
Issue number4
DOIs
Publication statusPublished - 1 Dec 2011

Keywords

  • p-Type ZnO
  • Sputtering
  • Transparent diode
  • Zinc nitride
  • Zinc oxide

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