Transport and interface states in high-kappa LaSiOx dielectric

Y. Y. Gomeniuk; Y. V. Gomeniuk; I. P. Tyagulskii; S. I. Tyagulskii; A. N. Nazarov; V. S. Lysenko; K. Cherkaoui; S. Monaghan; P. K. Hurley

doi:10.1016/J.MEE.2011.03.089

Transport and interface states in high-kappa LaSiOx dielectric

Y. Y. Gomeniuk
, Y. V. Gomeniuk
, I. P. Tyagulskii
, S. I. Tyagulskii
, A. N. Nazarov
, V. S. Lysenko
, K. Cherkaoui
, S. Monaghan
, P. K. Hurley

Tyndall MicroNano Systems

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronic Engineering
DOIs	https://doi.org/10.1016/J.MEE.2011.03.089
Publication status	Published - 2011

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10.1016/J.MEE.2011.03.089

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@article{5285e153cef54df99dc249f9f072616e,

title = "Transport and interface states in high-kappa LaSiOx dielectric",

author = "Gomeniuk, \{Y. Y.\} and Gomeniuk, \{Y. V.\} and Tyagulskii, \{I. P.\} and Tyagulskii, \{S. I.\} and Nazarov, \{A. N.\} and Lysenko, \{V. S.\} and K. Cherkaoui and S. Monaghan and Hurley, \{P. K.\}",

year = "2011",

doi = "10.1016/J.MEE.2011.03.089",

language = "Undefined/Unknown",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Transport and interface states in high-kappa LaSiOx dielectric

AU - Gomeniuk, Y. Y.

AU - Gomeniuk, Y. V.

AU - Tyagulskii, I. P.

AU - Tyagulskii, S. I.

AU - Nazarov, A. N.

AU - Lysenko, V. S.

AU - Cherkaoui, K.

AU - Monaghan, S.

AU - Hurley, P. K.

PY - 2011

Y1 - 2011

UR - https://publons.com/wos-op/publon/3832656/

U2 - 10.1016/J.MEE.2011.03.089

DO - 10.1016/J.MEE.2011.03.089

M3 - Article

SN - 0167-9317

JO - Microelectronic Engineering

JF - Microelectronic Engineering

ER -

Transport and interface states in high-kappa LaSiOx dielectric

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