Tunable Schottky barrier contacts to inxGa1-xas

  • C. Marinelli
  • , L. Sorba
  • , M. Lazzarino
  • , D. Kumar
  • , E. Pelucchi
  • , B. H. Müller
  • , D. Orani
  • , S. Rubini
  • , A. Franciosi
  • , S. De Franceschi
  • , F. Beltram

Research output: Contribution to journalArticlepeer-review

Abstract

Al/InxGa1-xAs(001) diodes incorporating Si bilayers deposited under As or Al flux were fabricated by molecular-beam epitaxy on GaAs(001) wafers for 0.2<x<0.4. Schottky barrier heights as high as 0.75 eV and as low as -0.10 eV could be reproducibly obtained. Diodes engineered for high barrier height systematically showed a higher thermal stability than low-barrier diodes. We discuss the composition dependence of the barrier height and the observed degradation behavior vis-a-vis of the predictions of the interface-dipole model of Schottky barrier tuning.

Original languageEnglish
Pages (from-to)2119-2127
Number of pages9
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume18
Issue number4
Publication statusPublished - 2000
Externally publishedYes

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