Two-Axis planar Hall magnetic field sensors with sub nanoTesla resolution

Proloy Taran Das; Hariharan Nhalil; Vladislav Mor; Moty Schultz; Nir Hasidim; Asaf Grosz; Lior Klein

doi:10.48550/arxiv.2504.06630

Two-Axis planar Hall magnetic field sensors with sub nanoTesla resolution

Proloy Taran Das
, Hariharan Nhalil
, Vladislav Mor
, Moty Schultz
, Nir Hasidim
, Asaf Grosz
, Lior Klein

Bar-Ilan University
Helmholtz-Zentrum Dresden-Rossendorf
Ben-Gurion University of the Negev

Research output: Contribution to journal › Article › peer-review

Abstract

Planar Hall effect (PHE) magnetic sensors are attractive for various applications where the field resolution is required in the range of sub-nano Tesla or in Pico Tesla. Here we present a detailed noise study of the PHE sensors consisting of two or three intersecting ellipses. It can be used to measure two axes of the magnetic field in the sensor plane in particular along the two perpendicular easy axes in the overlapping region for two intersecting ellipses and three easy axes at an angle of 60 degrees for three crossing ellipses. Thus, for each remanent magnetic state in the overlap area, the sensor can measure the vector component of the magnetic field perpendicular to the direction of the remanent magnetization. The two field components are measured with a field resolution less than 200 pT/sqrt(Hz) at 10 Hz and 350 pT/sqrt(Hz) at 1 Hz in the same region, while maintaining a similar size and noise level of a single-axis sensor. Furthermore, we discuss here the possible route for future improvement of the field resolution

Original language	English
Journal	ArXiv
DOIs	https://doi.org/10.48550/arxiv.2504.06630
Publication status	Published - 9 Apr 2025
Externally published	Yes

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Cite this

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title = "Two-Axis planar Hall magnetic field sensors with sub nanoTesla resolution",

abstract = "Planar Hall effect (PHE) magnetic sensors are attractive for various applications where the field resolution is required in the range of sub-nano Tesla or in Pico Tesla. Here we present a detailed noise study of the PHE sensors consisting of two or three intersecting ellipses. It can be used to measure two axes of the magnetic field in the sensor plane in particular along the two perpendicular easy axes in the overlapping region for two intersecting ellipses and three easy axes at an angle of 60 degrees for three crossing ellipses. Thus, for each remanent magnetic state in the overlap area, the sensor can measure the vector component of the magnetic field perpendicular to the direction of the remanent magnetization. The two field components are measured with a field resolution less than 200 pT/sqrt(Hz) at 10 Hz and 350 pT/sqrt(Hz) at 1 Hz in the same region, while maintaining a similar size and noise level of a single-axis sensor. Furthermore, we discuss here the possible route for future improvement of the field resolution",

author = "Das, \{Proloy Taran\} and Hariharan Nhalil and Vladislav Mor and Moty Schultz and Nir Hasidim and Asaf Grosz and Lior Klein",

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doi = "10.48550/arxiv.2504.06630",

language = "English",

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T1 - Two-Axis planar Hall magnetic field sensors with sub nanoTesla resolution

AU - Das, Proloy Taran

AU - Nhalil, Hariharan

AU - Mor, Vladislav

AU - Schultz, Moty

AU - Hasidim, Nir

AU - Grosz, Asaf

AU - Klein, Lior

PY - 2025/4/9

Y1 - 2025/4/9

N2 - Planar Hall effect (PHE) magnetic sensors are attractive for various applications where the field resolution is required in the range of sub-nano Tesla or in Pico Tesla. Here we present a detailed noise study of the PHE sensors consisting of two or three intersecting ellipses. It can be used to measure two axes of the magnetic field in the sensor plane in particular along the two perpendicular easy axes in the overlapping region for two intersecting ellipses and three easy axes at an angle of 60 degrees for three crossing ellipses. Thus, for each remanent magnetic state in the overlap area, the sensor can measure the vector component of the magnetic field perpendicular to the direction of the remanent magnetization. The two field components are measured with a field resolution less than 200 pT/sqrt(Hz) at 10 Hz and 350 pT/sqrt(Hz) at 1 Hz in the same region, while maintaining a similar size and noise level of a single-axis sensor. Furthermore, we discuss here the possible route for future improvement of the field resolution

AB - Planar Hall effect (PHE) magnetic sensors are attractive for various applications where the field resolution is required in the range of sub-nano Tesla or in Pico Tesla. Here we present a detailed noise study of the PHE sensors consisting of two or three intersecting ellipses. It can be used to measure two axes of the magnetic field in the sensor plane in particular along the two perpendicular easy axes in the overlapping region for two intersecting ellipses and three easy axes at an angle of 60 degrees for three crossing ellipses. Thus, for each remanent magnetic state in the overlap area, the sensor can measure the vector component of the magnetic field perpendicular to the direction of the remanent magnetization. The two field components are measured with a field resolution less than 200 pT/sqrt(Hz) at 10 Hz and 350 pT/sqrt(Hz) at 1 Hz in the same region, while maintaining a similar size and noise level of a single-axis sensor. Furthermore, we discuss here the possible route for future improvement of the field resolution

UR - https://publons.com/wos-op/publon/77262128/

U2 - 10.48550/arxiv.2504.06630

DO - 10.48550/arxiv.2504.06630

M3 - Article

JO - ArXiv

JF - ArXiv

ER -

Two-Axis planar Hall magnetic field sensors with sub nanoTesla resolution

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