Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties

Abi Waqas; Paolo Manfredi; Daniele Melati; B. S. Chowdhry; Andrea Melloni

doi:10.1063/1.5123699

Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties

Abi Waqas
, Paolo Manfredi
, Daniele Melati
, B. S. Chowdhry
, Andrea Melloni

Mehran University of Engineering & Technology
Polytechnic University of Turin
National Research Council of Canada
Polytechnic University of Milan

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Abstract

Fabrication technologies have to face the unavoidable reality of manufacturing uncertainties limiting the sustainable complexity and poses major challenges in achieving high production yield. This is particularly true for high-index-contrast photonic devices that are much longer than the operation wavelength; a small change in device dimensions can cause a dramatic phase error in the propagating light. While for compact photonic devices, the assumption of perfectly correlated variables can be a rather accurate description of the real variability, this condition might not be completely fulfilled when large circuits are considered. In this paper, we report the use of standard Polynomial Chaos Expansion technique for the stochastic analysis of photonics circuits in presence of multiple correlated random variables by exploiting the Karhunen-Loeve (KL) transformation.

Original language	English
Title of host publication	International Conference on Key Enabling Technologies, KEYTECH 2019
Editors	Inam Ul Ahad, Ibrahim Gaidan
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735418912
DOIs	https://doi.org/10.1063/1.5123699
Publication status	Published - 19 Aug 2019
Externally published	Yes
Event	1st International Conference on Key Enabling Technologies, KEYTECH 2019 - Istanbul, Turkey Duration: 24 Apr 2019 → 26 Apr 2019

Publication series

Name	AIP Conference Proceedings
Volume	2146
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	1st International Conference on Key Enabling Technologies, KEYTECH 2019
Country/Territory	Turkey
City	Istanbul
Period	24/04/19 → 26/04/19

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

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10.1063/1.5123699

Cite this

Waqas, A., Manfredi, P., Melati, D., Chowdhry, B. S., & Melloni, A. (2019). Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties. In I. U. Ahad, & I. Gaidan (Eds.), International Conference on Key Enabling Technologies, KEYTECH 2019 Article 020012 (AIP Conference Proceedings; Vol. 2146). American Institute of Physics Inc.. https://doi.org/10.1063/1.5123699

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title = "Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties",

abstract = "Fabrication technologies have to face the unavoidable reality of manufacturing uncertainties limiting the sustainable complexity and poses major challenges in achieving high production yield. This is particularly true for high-index-contrast photonic devices that are much longer than the operation wavelength; a small change in device dimensions can cause a dramatic phase error in the propagating light. While for compact photonic devices, the assumption of perfectly correlated variables can be a rather accurate description of the real variability, this condition might not be completely fulfilled when large circuits are considered. In this paper, we report the use of standard Polynomial Chaos Expansion technique for the stochastic analysis of photonics circuits in presence of multiple correlated random variables by exploiting the Karhunen-Loeve (KL) transformation.",

author = "Abi Waqas and Paolo Manfredi and Daniele Melati and Chowdhry, \{B. S.\} and Andrea Melloni",

note = "Publisher Copyright: {\textcopyright} 2019 American Institute of Physics Inc.. All rights reserved.; 1st International Conference on Key Enabling Technologies, KEYTECH 2019 ; Conference date: 24-04-2019 Through 26-04-2019",

year = "2019",

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doi = "10.1063/1.5123699",

language = "English",

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publisher = "American Institute of Physics Inc.",

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Waqas, A, Manfredi, P, Melati, D, Chowdhry, BS & Melloni, A 2019, Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties. in IU Ahad & I Gaidan (eds), International Conference on Key Enabling Technologies, KEYTECH 2019., 020012, AIP Conference Proceedings, vol. 2146, American Institute of Physics Inc., 1st International Conference on Key Enabling Technologies, KEYTECH 2019, Istanbul, Turkey, 24/04/19. https://doi.org/10.1063/1.5123699

Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties. / Waqas, Abi; Manfredi, Paolo; Melati, Daniele et al.
International Conference on Key Enabling Technologies, KEYTECH 2019. ed. / Inam Ul Ahad; Ibrahim Gaidan. American Institute of Physics Inc., 2019. 020012 (AIP Conference Proceedings; Vol. 2146).

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

TY - GEN

T1 - Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties

AU - Waqas, Abi

AU - Manfredi, Paolo

AU - Melati, Daniele

AU - Chowdhry, B. S.

AU - Melloni, Andrea

PY - 2019/8/19

Y1 - 2019/8/19

N2 - Fabrication technologies have to face the unavoidable reality of manufacturing uncertainties limiting the sustainable complexity and poses major challenges in achieving high production yield. This is particularly true for high-index-contrast photonic devices that are much longer than the operation wavelength; a small change in device dimensions can cause a dramatic phase error in the propagating light. While for compact photonic devices, the assumption of perfectly correlated variables can be a rather accurate description of the real variability, this condition might not be completely fulfilled when large circuits are considered. In this paper, we report the use of standard Polynomial Chaos Expansion technique for the stochastic analysis of photonics circuits in presence of multiple correlated random variables by exploiting the Karhunen-Loeve (KL) transformation.

AB - Fabrication technologies have to face the unavoidable reality of manufacturing uncertainties limiting the sustainable complexity and poses major challenges in achieving high production yield. This is particularly true for high-index-contrast photonic devices that are much longer than the operation wavelength; a small change in device dimensions can cause a dramatic phase error in the propagating light. While for compact photonic devices, the assumption of perfectly correlated variables can be a rather accurate description of the real variability, this condition might not be completely fulfilled when large circuits are considered. In this paper, we report the use of standard Polynomial Chaos Expansion technique for the stochastic analysis of photonics circuits in presence of multiple correlated random variables by exploiting the Karhunen-Loeve (KL) transformation.

UR - https://www.scopus.com/pages/publications/85071672392

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DO - 10.1063/1.5123699

M3 - Conference proceeding

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T3 - AIP Conference Proceedings

BT - International Conference on Key Enabling Technologies, KEYTECH 2019

A2 - Ahad, Inam Ul

A2 - Gaidan, Ibrahim

PB - American Institute of Physics Inc.

T2 - 1st International Conference on Key Enabling Technologies, KEYTECH 2019

Y2 - 24 April 2019 through 26 April 2019

ER -

Uncertainty aware design of photonic integrated circuits in presence of correlated manufacturing uncertainties

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