Valence band offset of InN/AlN heterojunctions measured by x-ray photoelectron spectroscopy
- P. D.C. King
- , T. D. Veal
- , P. H. Jefferson
- , C. F. McConville
- , T. Wang
- , P. J. Parbrook
- , Hai Lu
- , W. J. Schaff
Research output: Contribution to journal › Article › peer-review